Modules / 07
Semiconductor
FabSim
“Where in the fab are we losing yield, capacity and cycle time — and which lever recovers the most?”
Available module
What it does
Six simulation modules — chamber matching, defect flow, sampling optimisation, capacity planning, excursion risk and work-in-progress flow — run in-browser on realistic synthetic data, so a first evaluation needs no upload of sensitive fab data.
Capabilities
Inside FabSim
Chamber matching
Align chamber behaviour to recover yield.
Defect flow and sampling
Trace defects and optimise inspection sampling.
Capacity planning
Find the throughput lever that matters.
Excursion risk and WIP flow
Anticipate excursions and shorten cycle time.
Try FabSim on your own data
Nominate the decision that hurts most and we will run this module against a representative case from your operation.